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Disclosure Nr.: OTT013995 AccessProof™ Datum: 2026-06-25		Method for Enhanced Reference Scan Acquisition Using B1 Reflection Monitoring in MRI Sprache: English Offengelegt von: Siemens AG Autoren: Dr. Mario Zeller, DE-Erlangen; Dr. Christian Meixner, DE-Erlangen AccessProof™: 2026-06-25 Persistent Identifier: urn:nbn:de:101:1-2606251201000.479134264509 Disclosure für 15.00 € kaufen

Method for Enhanced Reference Scan Acquisition Using B1 Reflection Monitoring in MRI