Increased X-Ray Tube Current Accuracy and Control, Shortened X-Ray Preparation Time, and Fitting of Emitter Emission Curves with Neuronal Networks

Sprache: English
Offengelegt von: Siemens AG
Autoren: Stefan Schmidt, DE-Forchheim; Martin Fotta, DE-Forchheim; Felix Stockmeyer, DE-Forchheim; Dr. Wei Fan, DE-Forchheim